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Electron beam induced current investigations of interface exposed to chemical and electrical stresses
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10.1063/1.3339303
/content/aip/journal/apl/96/9/10.1063/1.3339303
http://aip.metastore.ingenta.com/content/aip/journal/apl/96/9/10.1063/1.3339303
/content/aip/journal/apl/96/9/10.1063/1.3339303
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/content/aip/journal/apl/96/9/10.1063/1.3339303
2010-03-01
2014-10-25
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Electron beam induced current investigations of Pt/SrTiO3−x interface exposed to chemical and electrical stresses
http://aip.metastore.ingenta.com/content/aip/journal/apl/96/9/10.1063/1.3339303
10.1063/1.3339303
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