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The XPS spectra in (a) show the survey scans for fluorinated (top), hydrogenated (middle), and oxidized (bottom) UNCD samples. The inset corresponds to the fluorine KLL Auger spectrum of the fluorinated sample. The graphs (b) and (c) are the high-resolution XPS spectra of the and region for all three surfaces.
(a) AFM image of a hydrogenated diamond surface obtained under ambient conditions in tapping mode. (b) Constant-current STM image (2.1 nm rms) of a hydrogenated diamond surface with tip bias voltage at and tunneling current of 120 pA. The high resolution STM image in (c) and (d) were recorded with a tip bias voltage of and 120 pA tunneling current. The rms values corresponding to (c) and (d) are 0.3 nm and 0.24 nm, respectively. The scale bar represents 100 nm in the upper two images and the z-scale is 10 nm. In the lower two images, the scale bar is 30 nm in (c) and 15 nm (d); the z-scale is 1 nm.
Normalized differential conductance (dI/dV)/(I/V) of hydrogenated (a), oxidized (b), and fluorinated (c) UNCD surfaces. The normalized differential tunneling conductance is plotted vs the applied tip voltage. Each spectrum is averaged over 25 scanned spectra.
XPS surface elemental quantification.
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