banner image
No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
Electronic properties of ultrananocrystalline diamond surfaces
Rent this article for


Image of FIG. 1.
FIG. 1.

The XPS spectra in (a) show the survey scans for fluorinated (top), hydrogenated (middle), and oxidized (bottom) UNCD samples. The inset corresponds to the fluorine KLL Auger spectrum of the fluorinated sample. The graphs (b) and (c) are the high-resolution XPS spectra of the and region for all three surfaces.

Image of FIG. 2.
FIG. 2.

(a) AFM image of a hydrogenated diamond surface obtained under ambient conditions in tapping mode. (b) Constant-current STM image (2.1 nm rms) of a hydrogenated diamond surface with tip bias voltage at and tunneling current of 120 pA. The high resolution STM image in (c) and (d) were recorded with a tip bias voltage of and 120 pA tunneling current. The rms values corresponding to (c) and (d) are 0.3 nm and 0.24 nm, respectively. The scale bar represents 100 nm in the upper two images and the z-scale is 10 nm. In the lower two images, the scale bar is 30 nm in (c) and 15 nm (d); the z-scale is 1 nm.

Image of FIG. 3.
FIG. 3.

Normalized differential conductance (dI/dV)/(I/V) of hydrogenated (a), oxidized (b), and fluorinated (c) UNCD surfaces. The normalized differential tunneling conductance is plotted vs the applied tip voltage. Each spectrum is averaged over 25 scanned spectra.


Generic image for table
Table I.

XPS surface elemental quantification.


Article metrics loading...


Full text loading...

This is a required field
Please enter a valid email address
752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Electronic properties of ultrananocrystalline diamond surfaces