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Ultrathin Cu-Ti bilayer transparent conductors with enhanced figure-of-merit and stability
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10.1063/1.3341201
/content/aip/journal/apl/96/9/10.1063/1.3341201
http://aip.metastore.ingenta.com/content/aip/journal/apl/96/9/10.1063/1.3341201
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

Visible optical transparency (VOT), averaged over the 375–780 nm range, as a function of sheet resistance for different sample sets, , , and . The value of Cu thickness identifies each point in the curves. The data for SWCNT and graphene are also shown.

Image of FIG. 2.
FIG. 2.

Figure-of-merit for different sample sets, , , and . The total thickness is the sum of deposited Cu and Ti thicknesses. Inset is vs for determination of percolation threshold. The value of Cu thickness identifies each point in the curves.

Image of FIG. 3.
FIG. 3.

(a) Model for calculation transparency for a multilayer film system, (b) average visible reflection from the experimental and calculated data for Cu(6.5) and samples, (c) and (d) show the experimental and calculated transparency spectra for Cu(6.5) and samples, respectively.

Image of FIG. 4.
FIG. 4.

Polar figure for the stability of the proposed Cu based TCs. The horizontal axis corresponds to ideal stability.

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/content/aip/journal/apl/96/9/10.1063/1.3341201
2010-03-05
2014-04-19
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Ultrathin Cu-Ti bilayer transparent conductors with enhanced figure-of-merit and stability
http://aip.metastore.ingenta.com/content/aip/journal/apl/96/9/10.1063/1.3341201
10.1063/1.3341201
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