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Defect structure and materials “hardening” in -doped ferroelectrics
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10.1063/1.3455888
/content/aip/journal/apl/97/1/10.1063/1.3455888
http://aip.metastore.ingenta.com/content/aip/journal/apl/97/1/10.1063/1.3455888
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

X-ray diffraction patterns of undoped and -doped ranging from Fe.

Image of FIG. 2.
FIG. 2.

Polarization and strain hysteresis for undoped (open symbols) and -doped (bold symbols) ceramics (see Ref. 20).

Image of FIG. 3.
FIG. 3.

X-band (9.8 GHz) EPR-spectra of -doped for varying dopant concentrations (bold) as compared to (dashed) at ambient temperature. (a) -doped BNT powders calcined at for 2 h. (b) -doped BNT ceramics sintered at for 1 h. The vertical dashed line represents and the vertical dotted line marks the effective -value for the observed secondary phase.

Image of FIG. 4.
FIG. 4.

Schematic illustration of the defect-structural arrangement of the (truncated) oxygen octahedra for undoped (a) and -doped BNT containing a defect dipole (b). The corresponding orientations of spontaneous polarization and defect polarization are indicated by arrows.

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/content/aip/journal/apl/97/1/10.1063/1.3455888
2010-07-07
2014-04-24
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Defect structure and materials “hardening” in Fe2O3-doped [Bi0.5Na0.5]TiO3 ferroelectrics
http://aip.metastore.ingenta.com/content/aip/journal/apl/97/1/10.1063/1.3455888
10.1063/1.3455888
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