Full text loading...
(a) Atomic force microscope images of the surfaces of the original epiready InP substrate, recovered InP substrate surface after the first and second ELO processes following the removal of the protection and etch stop layers, and an ELO surface without the protection layer. (b) Image of lifted-off 2 in. diameter epitaxial layer containing an array of ITO/InP thin film solar cells fabricated by a combination of ELO and cold-weld bonding to a thick Kapton® sheet.
The x-ray photoelectron spectra from the fresh and the ELO processed substrate surfaces. Inset: The 2× and 4× surface reconstruction patterns obtained by reflection high-energy electron diffraction for the fresh and the ELO-processed substrate after eliminating oxide layer.
Current density vs voltage characteristics of the first and the second ELO processed ITO/InP and the control solar cells bonded to a Kapton® sheet, and measured under 1 sun, AM 1.5G simulated solar illumination. Inset: Surface morphology of the original substrate (a) after ELO and protection layer removal and (b) after the ELO without the protection layer.
Comparison of device performances under AM 1.5G simulated solar spectrum, and the dark current at −1 V , ideality factor , and specific series resistance in the dark.
Article metrics loading...