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Instability in threshold voltage and subthreshold behavior in Hf–In–Zn–O thin film transistors induced by bias-and light-stress
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10.1063/1.3480547
/content/aip/journal/apl/97/11/10.1063/1.3480547
http://aip.metastore.ingenta.com/content/aip/journal/apl/97/11/10.1063/1.3480547
/content/aip/journal/apl/97/11/10.1063/1.3480547
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/content/aip/journal/apl/97/11/10.1063/1.3480547
2010-09-14
2014-10-25
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Instability in threshold voltage and subthreshold behavior in Hf–In–Zn–O thin film transistors induced by bias-and light-stress
http://aip.metastore.ingenta.com/content/aip/journal/apl/97/11/10.1063/1.3480547
10.1063/1.3480547
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