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(a) GXRD pattern of 4.3% Mn:ITO film and (b) shift in (222) peak position of ITO thin film with Mn doping.
(a) XPS Survey spectra of ITO (solid line), 1.6% Mn:ITO (dotted line), and 4.3% Mn:ITO (dashed line). The increase in peak intensity (indicated by the arrows) with Mn concentration of the doped films is clearly seen.
High resolution XPS spectra of core level. Insets (a) and (b) show the high resolution XPS spectra of and core levels, respectively.
core level XPS experimental spectra (open circles) along with the deconvoluted components: peak and satellite (dashed lines), peak (dotted line) and the overall fit (solid line). The inset shows the core level spectra (including the core level).
Variation in resistivity at with Mn concentration for Mn:ITO films. The dotted line is only to guide the eye. The variation in resistivity of ITO (circles), 1.6% Mn:ITO (triangles), and 4.3% Mn:ITO films (squares) with temperature is shown as inset.
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