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Correlation of Mn charge state with the electrical resistivity of Mn doped indium tin oxide thin films
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10.1063/1.3481800
/content/aip/journal/apl/97/11/10.1063/1.3481800
http://aip.metastore.ingenta.com/content/aip/journal/apl/97/11/10.1063/1.3481800
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

(a) GXRD pattern of 4.3% Mn:ITO film and (b) shift in (222) peak position of ITO thin film with Mn doping.

Image of FIG. 2.
FIG. 2.

(a) XPS Survey spectra of ITO (solid line), 1.6% Mn:ITO (dotted line), and 4.3% Mn:ITO (dashed line). The increase in peak intensity (indicated by the arrows) with Mn concentration of the doped films is clearly seen.

Image of FIG. 3.
FIG. 3.

High resolution XPS spectra of core level. Insets (a) and (b) show the high resolution XPS spectra of and core levels, respectively.

Image of FIG. 4.
FIG. 4.

core level XPS experimental spectra (open circles) along with the deconvoluted components: peak and satellite (dashed lines), peak (dotted line) and the overall fit (solid line). The inset shows the core level spectra (including the core level).

Image of FIG. 5.
FIG. 5.

Variation in resistivity at with Mn concentration for Mn:ITO films. The dotted line is only to guide the eye. The variation in resistivity of ITO (circles), 1.6% Mn:ITO (triangles), and 4.3% Mn:ITO films (squares) with temperature is shown as inset.

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/content/aip/journal/apl/97/11/10.1063/1.3481800
2010-09-15
2014-04-25
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Correlation of Mn charge state with the electrical resistivity of Mn doped indium tin oxide thin films
http://aip.metastore.ingenta.com/content/aip/journal/apl/97/11/10.1063/1.3481800
10.1063/1.3481800
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