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(a) The schematics of the THz-wave-induced PL quenching experiment. (b) The measured time-integrated PL emission spectra of CdTe and GaAs at the peak THz intensity of (solid lines) and (dashed lines).
The solid squares and dots show the measured THz intensity dependence of time-integrated PL in CdTe and GaAs, respectively. The results are normalized. Solid lines are the linear fit.
The measured (solid symbols) and calculated (solid lines) time-resolved PL quenching in CdTe at 837 nm (top) and in GaAs at 850 nm (middle) in comparison with the time-domain waveform of a THz pulse (bottom).
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