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AFM images of (a) a blank AAO substrate and (b) a CdSe QD drop-cast AAO sample.
(a) PL spectra of CdSe/ZnS QDs cast on Si (curve 1) and cast on AAO supported on substrates with different coatings [curve 2: Si with 920 nm of , curve 3: Si with 235 nm of , curve 4: Si (with native ), curve 5: Si with 235 nm topped by 50 nm Au]. The inset in (a) is a PL comparison for supports 3 and 5, (b) fluorescence pictures of three (left) AAO/QD samples sitting on Si in comparison with the same QD cast on a Si substrate (right), (c) transmittance of a blank AAO and reflectance spectra of the Si substrates with different coatings used in (a).
PL peak intensity responses to exposures of xylenes balanced in a dry air from an AAO/CdSe QD (core) sample placed on Si. The inset (a) shows two-cycle reversible PL enhancement of the sample upon exposure to a high level of xylenes vapor and the inset (b) is a zoomed-in sensing trace at low levels of xylenes.
PL peak intensity change as a function of (a) BTX concentrations from an AAO/CdSe QD sample on Si, (b) a comparison of xylenes sensing characteristics of an AAO/CdSe/ZnS QD sample sitting on Si supports with/without an Au coating.
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