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(a) Atomic force microscope image of the top layer of the P–Si 1D structure used, (b) schematic cross section view of the layered structure where AL stands for alignment layer; (c) and (d) are 20× polarized microscope images of the two samples MC1 and MC2, showing their corresponding filter transmission; [(e)–(h)] schematic drawings to illustrate some of the LC configurations inside the pores showing the UA, homeotropic, PR and ER configurations respectively. The PP configuration is explained later in Fig. 4.
Measured and calculated polarized reflectivity spectra for the two nanoPS 1D PC structures before filling with LC. The parameters used for the two samples are: fill factors are (0.22, 0.32), number of periods is 10, cylinders length is 25 nm and width is 10 nm. The layers thicknesses for MC1 are (81 nm and 48 nm) while for MC2: (111 nm and 60 nm).
Measured and calculated polarized reflectivity spectra for the nanoPS structures filled with LC (a) MC1 sample (b) MC2 sample. Note the splitting due to the polarization dependence.
(a) Angles defining the molecular director orientation in the PP geometry (b) The director field in a cylindrical cross section divided into regions with nearly the same uniform orientations: . The field distribution in (b) is taken from Fig. 4 of Ref. 7.
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