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(a) Exploded view of the device structure. (b) Scanning electron micrograph of a device similar to the ones investigated in this work. The scale bar is . (c) Schematic of the measurement set-up used to study TP (superimposed on a scanning electron micrograph showing a number of devices on a single chip before the second metallization).
(a) Schematic of the relevant energy scales in the ADL system: (a1) A situation when just pushes through , (a2) a relatively high resulting in strong scattering centers, (a3) variation in with a fixed . (b) Commensurability in two devices, dev1 (, ), and dev2 (, ) at 4.2 K. Arrows mark the position of commensurability peaks corresponding to cyclotron orbits around 1, 4, and 9 ADs. (c) MR as is varied from −35 to −20 V. Curves have been offset by for clarity. (d) Variation in the fundamental commensurability peak with , showing a clear modulation of . Dashed vertical lines serve as a guide to the eye.
(a) Variation in MTP as is changed from −35 to −21 V . Dashed line shows the MR at for comparison. (b) A systematic shift in position of the fundamental commensurability feature in MTP. Dashed vertical lines are guides to the eye. (c) (upper/lower) panel shows vs . A, B, and C show three distinct transport regimes in the device. (d) Shift in position of with .
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