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Linking hopping conductivity to giant dielectric permittivity in oxides
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10.1063/1.3495779
/content/aip/journal/apl/97/13/10.1063/1.3495779
http://aip.metastore.ingenta.com/content/aip/journal/apl/97/13/10.1063/1.3495779
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

Photos and room temperature dielectric properties of SPS sintered and reoxidized BT@Si ceramics with different silica shell thickness: 0, 2, and 5 nm.

Image of FIG. 2.
FIG. 2.

(a) EPR spectra recorded at 4 K in: a-BT500@Si5 “green composite,” b-BT500@Si5 SPS sintered and reoxidized, c-BT ceramics SPS sintered, d-BT ceramics SPS sintered and reoxidized, e-BT “green powder” with particles size 500 nm; (b)-EPR spectra of SPS sintered and reoxidized BT500@Si5 composite recorded at several temperatures: a—4 K, b—20 K, c—50 K, d—60 K, and e—100 K (intensity multiplied by 2).

Image of FIG. 3.
FIG. 3.

Dielectric relaxation time (left scale, taken from Ref. 13) and -V(O) linewidth vs temperature in an Arrhenius scale. The common slope (100 meV) of both lines calls for a common origin for these two mechanisms.

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/content/aip/journal/apl/97/13/10.1063/1.3495779
2010-09-27
2014-04-18
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Linking hopping conductivity to giant dielectric permittivity in oxides
http://aip.metastore.ingenta.com/content/aip/journal/apl/97/13/10.1063/1.3495779
10.1063/1.3495779
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