1887
banner image
No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
Band offsets determination and interfacial chemical properties of the system
Rent:
Rent this article for
USD
10.1063/1.3499655
/content/aip/journal/apl/97/16/10.1063/1.3499655
http://aip.metastore.ingenta.com/content/aip/journal/apl/97/16/10.1063/1.3499655
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

energy-loss spectrum for 20 nm film. The inset is a magnified region of the energy loss spectrum.

Image of FIG. 2.
FIG. 2.

XPS spectra of (a) core level and valence band of GaSb wafer, (b) core level and valence band of thick sample, and (c) and core levels of thin sample.

Image of FIG. 3.
FIG. 3.

XPS spectra of core level of sample with various surface treatments applied prior to oxide deposition (a) and HCl and (b) .

Image of FIG. 4.
FIG. 4.

(a) XPS spectra of and for sample with HCl surface treatment applied prior to oxide deposition and (b) The ratio of for the various surface treatments.

Loading

Article metrics loading...

/content/aip/journal/apl/97/16/10.1063/1.3499655
2010-10-22
2014-04-20
Loading

Full text loading...

This is a required field
Please enter a valid email address
752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Band offsets determination and interfacial chemical properties of the Al2O3/GaSb system
http://aip.metastore.ingenta.com/content/aip/journal/apl/97/16/10.1063/1.3499655
10.1063/1.3499655
SEARCH_EXPAND_ITEM