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Phase periodic conductance oscillations at subgap Andreev resonances in tunnel junctions
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View: Figures


Image of FIG. 1.
FIG. 1.

(a) Schematic cross section of a high Josephson tunnel junction. (b) IV curves of representative junctions with , 1.2, 2.4, and 4.8 nm. (c) Junction quality product as a function of . Each encircled set of data represents junctions on one chip with a fixed value of . (d) Field dependence of for and 4.8 nm.

Image of FIG. 2.
FIG. 2.

Panels (a) and (b) show the MW irradiated (solid line) and unirradiated (dotted line) IV curves of junctions with and 0.6 nm, respectively. (c) MW irradiated dynamic conductance curves at various temperatures between 4.2 and 9 K shown for and 2.4 nm. The inset plots the temperature dependence of energy gaps extracted from panel (c). The solid lines in the inset are fits to the BCS relation described in the text.

Image of FIG. 3.
FIG. 3.

(a) dI/dV-V curves measured at various magnetic fields between 0 and 130 Oe using a fixed MW field as an suppressor. The dotted curve belongs to the unirradiated junction measured at zero field. (b) The magnetic field dependence of normalized dynamic resistance of the junction around the first SHG. The pattern of the same junction is plotted on the right-hand axis. (c) Field dependence of in the second SHG region.


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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Phase periodic conductance oscillations at subgap Andreev resonances in Nb–Al–AlOx–Al–Nb tunnel junctions