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Experimental verification of negative refraction for a wedge-type negative index metamaterial operating at terahertz
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10.1063/1.3511540
/content/aip/journal/apl/97/18/10.1063/1.3511540
http://aip.metastore.ingenta.com/content/aip/journal/apl/97/18/10.1063/1.3511540
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

Schematic of the wedge-type devices: (a) one unit cell and (b) ten layers prism. Simulation of electric field mapping for a ten-stair prism at (a) 0.46 THz and (d) 0.49 THz.

Image of FIG. 2.
FIG. 2.

Transmission modulus as a function of the refracted beam angle for a prism with ten stacked hole arrays.

Image of FIG. 3.
FIG. 3.

Photograph of the prism structure device (a) and of an optical microscope zoomed view of the prism with ten stacked hole arrays (b).

Image of FIG. 4.
FIG. 4.

Schematic of the goniometric setup with the illustration of the optical and THz pulses in red and blue, respectively, and of the Si lenses in detection and emission (unscaled in this schematic).

Image of FIG. 5.
FIG. 5.

Frequency dependence of the effective refractive index deduced from experiment and compared to the variations calculated for slab- and prism-devices.

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/content/aip/journal/apl/97/18/10.1063/1.3511540
2010-11-01
2014-04-16
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Experimental verification of negative refraction for a wedge-type negative index metamaterial operating at terahertz
http://aip.metastore.ingenta.com/content/aip/journal/apl/97/18/10.1063/1.3511540
10.1063/1.3511540
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