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(a) The SEM images of PC template. The figure inset is the cross section of the sample. (b) The computer simulation of (a). (c) The close-up SEM image of the ZnO inverse PCs. The inset is the cross section of the sample. (d) shows the computer simulation of (c).
(a) Optical intensity reflection spectrum of the fcc-type photoresist template in Fig. 1(a), showing one pronounced peaks around . (b) Corresponding band-structure calculation along the measured direction . (c) Corresponding band-structure calculation of the ZnO inverse PC in Fig. 2(a). The gray shaded area corresponds to the band gap at the measured direction. (d) Optical intensity reflection spectrum of the ZnO inverse PC in Fig. 2(a), showing one pronounced peaks around and two shoulders at 2.60 and .
(a) PL and transmission spectra of the ZnO PC and the reference ZnO. (b) Time-resolved measurement of the reference ZnO (black circle) and the ZnO with PC structure (red triangle). The blue solid lines are single exponential fitting curve of the data. The figure inset shows the comparison of the exciton emission intensity of the reference ZnO (red solid curve) and the ZnO with PC structure (blue dashed curve) under the same excitation condition. (c) Emission spectrum as a function for excitation power for the ZnO PC. The figure inset shows the ASE/PL spectra for ZnO PC and nonstructured ZnO at the same excitation intensity of .
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