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Efficient data averaging for spin noise spectroscopy in semiconductors
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10.1063/1.3505342
/content/aip/journal/apl/97/19/10.1063/1.3505342
http://aip.metastore.ingenta.com/content/aip/journal/apl/97/19/10.1063/1.3505342
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

(a) Standard setup for semiconductor SNS. (b) Typical experimental spin noise power spectrum. The laser shot noise background is subtracted.

Image of FIG. 2.
FIG. 2.

(a) Input-output characteristics of a symmetric midrise digitizer . (b) SNR of a simulated spin noise measurement with averages. (c) for different random number sets; all other data in this letter is acquired by means of the same set of random numbers.

Image of FIG. 3.
FIG. 3.

(a) as a function of bit depth for different voltage loads. The ratio of spin noise to shot noise is fixed to . The solid lines are calculated by Eqs. (1) and (2) and corrected for the statistic deviation from 0.01. The inset shows as a function of a superimposed dc signal revealing the effective 1-bit quantization at low input load. (b) as a function of input load for different bit depths. The broken line gives the overload error for 8 bit. The solid lines are calculated with these values for in Eq. (2).

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/content/aip/journal/apl/97/19/10.1063/1.3505342
2010-11-11
2014-04-24
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Efficient data averaging for spin noise spectroscopy in semiconductors
http://aip.metastore.ingenta.com/content/aip/journal/apl/97/19/10.1063/1.3505342
10.1063/1.3505342
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