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Experimental setup to measure the critical fluence for dielectric breakdown with a pair of equal pulses.
Critical fluence of a pair of identical pulses for breakdown in hafnia films on fused silica as a function of the pulse separation for two pulse durations. The values are the fluence of the individual pulses normalized to the single pulse breakdown threshold. The solid line is a guide to the eye while the dashed section is the predicted behavior.
Simplified energy diagram for electron excitation and relaxation in hafnia films. A single midgap state is considered, which can be ionized by a one-photon absorption process.
Calculated damage fluence (normalized) of hafnia films probed by a pair of pulses as a function of delay for different material parameters. The solid line was obtained for , , and . The other curves were obtained by changing one parameter starting from this parameter set.
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