banner image
No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
Transient phenomena in the dielectric breakdown of optical films probed by ultrafast laser pulse pairs
Rent this article for
View: Figures


Image of FIG. 1.
FIG. 1.

Experimental setup to measure the critical fluence for dielectric breakdown with a pair of equal pulses.

Image of FIG. 2.
FIG. 2.

Critical fluence of a pair of identical pulses for breakdown in hafnia films on fused silica as a function of the pulse separation for two pulse durations. The values are the fluence of the individual pulses normalized to the single pulse breakdown threshold. The solid line is a guide to the eye while the dashed section is the predicted behavior.

Image of FIG. 3.
FIG. 3.

Simplified energy diagram for electron excitation and relaxation in hafnia films. A single midgap state is considered, which can be ionized by a one-photon absorption process.

Image of FIG. 4.
FIG. 4.

Calculated damage fluence (normalized) of hafnia films probed by a pair of pulses as a function of delay for different material parameters. The solid line was obtained for , , and . The other curves were obtained by changing one parameter starting from this parameter set.


Article metrics loading...


Full text loading...

This is a required field
Please enter a valid email address
752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Transient phenomena in the dielectric breakdown of HfO2 optical films probed by ultrafast laser pulse pairs