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Crystal defect topography of Stranski–Krastanow quantum dots by atomic force microscopy
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10.1063/1.3514237
/content/aip/journal/apl/97/19/10.1063/1.3514237
http://aip.metastore.ingenta.com/content/aip/journal/apl/97/19/10.1063/1.3514237
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

AFM image (signal amplitudes) of the top surface of the QD structure grown at low . (a) scan area shows a large number of square defects. (b) and (c) depict zoom-in on the defects.

Image of FIG. 2.
FIG. 2.

Dependence of the surface defect density on the QD growth temperature. The insets show AFM scans for selected values of with circles indicating the position of the surface defects.

Image of FIG. 3.
FIG. 3.

Dependence of the PL spectrum on the growth temperature of the QDs. Dots represent the maximum of the ground state emission. The inset shows dependence of the FWHM on the QD growth temperature.

Image of FIG. 4.
FIG. 4.

(a) 220 bright field TEM micrograph of the PL structure grown at . (b) Zoom-in on the SF depicting a big QD as a source of the defect. Small interference patterns correspond to normal dots. (c) Schematic of the origin of the surface square defects and method of calculation of the SF origin depth.

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/content/aip/journal/apl/97/19/10.1063/1.3514237
2010-11-08
2014-04-24
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Crystal defect topography of Stranski–Krastanow quantum dots by atomic force microscopy
http://aip.metastore.ingenta.com/content/aip/journal/apl/97/19/10.1063/1.3514237
10.1063/1.3514237
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