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(a) Cross-sectional and (b) plane view SEM micrographs of CZTSe thin film deposited by a coevaporation technique at of . (c) XRD patterns and (d) Raman spectra of the same sample.
values of CZTSe thin film shown in Fig. 1 , estimated by various methods; (a) vs curve obtained by transmission measurement (inset), (b) vs curve obtained by EQE measurement (inset), and (c) PL spectra measured at 10 K.
(a) vs curves and (b) XRD patterns of CTZSe thin films synthesized at various .
AES depth profiles of the thin films synthesized at of (a) , (b) , and (c) , respectively.
Summary of of CZTSe reported in the literatures with the corresponding methods for sample preparation, determination of , and phase analysis.
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