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Atomic scale characterization of titanium Ohmic contacts to SiC using three dimensional atom probe tomography and high resolution transmission electron microscopy
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10.1063/1.3464322
/content/aip/journal/apl/97/2/10.1063/1.3464322
http://aip.metastore.ingenta.com/content/aip/journal/apl/97/2/10.1063/1.3464322
/content/aip/journal/apl/97/2/10.1063/1.3464322
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/content/aip/journal/apl/97/2/10.1063/1.3464322
2010-07-15
2014-07-12
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Atomic scale characterization of titanium Ohmic contacts to SiC using three dimensional atom probe tomography and high resolution transmission electron microscopy
http://aip.metastore.ingenta.com/content/aip/journal/apl/97/2/10.1063/1.3464322
10.1063/1.3464322
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