1887
banner image
No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
Reduced leakage current in Josephson tunnel junctions with codeposited barriers
Rent:
Rent this article for
USD
10.1063/1.3518983
/content/aip/journal/apl/97/23/10.1063/1.3518983
http://aip.metastore.ingenta.com/content/aip/journal/apl/97/23/10.1063/1.3518983
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

RHEED (a) and AFM (c) from a 65 Å Al (111) film grown on Nb (110). Panels (b) and (d) show similar measurements made on a 200 Å thick Al layer. AFM scan areas are .

Image of FIG. 2.
FIG. 2.

Tunnel junction characteristics measured at 4.2 K for devices with differing Al layer thicknesses. Both had diffused oxide barriers, and the only substantial difference was the falloff width in the quasiparticle curve at the gap voltage.

Image of FIG. 3.
FIG. 3.

Fiske modes for a device with 15 Å of codeposited . Colors represent taken at 4.2 K with different applied fields in the range of 0–17 G. The reentrant shape of the subgap current leads to retrapping even when the critical current is nulled. The inset shows the modulation of with field strength.

Image of FIG. 4.
FIG. 4.

characteristics of three different junctions expanded to show the subgap current in greater detail: one with 15 Å of codeposited , one with 20 Å of codeposited , and one with a diffused barrier. The theoretical prediction is also shown. Current values have been scaled according to the devices’ normal-state resistances.

Loading

Article metrics loading...

/content/aip/journal/apl/97/23/10.1063/1.3518983
2010-12-10
2014-04-18
Loading

Full text loading...

This is a required field
Please enter a valid email address
752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Reduced leakage current in Josephson tunnel junctions with codeposited barriers
http://aip.metastore.ingenta.com/content/aip/journal/apl/97/23/10.1063/1.3518983
10.1063/1.3518983
SEARCH_EXPAND_ITEM