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Monolithic diamond optics for single photon detection
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View: Figures


Image of FIG. 1.
FIG. 1.

[(a) and (b)] Ray propagation (a) for a single emitting dipole oriented parallel to the diamond flat surface and (b) for a dipole located at the center of an hemispherical diamond SIL. (c) Computed collection efficiencies of NV defect PL as a function of the NA of the collection optics. The simulation is performed for NV defects in a [100]-oriented sample with and without SIL. The inset shows the atomic structure of the NV defect in diamond.

Image of FIG. 2.
FIG. 2.

(a) Experimental setup. BS: quartz plate; O: microscope air-objective ; PH: diameter pinhole; F: 580 nm long-pass filter; FM: flip mirror directing the collected PL either to an imaging spectrometer or to a Hanbury‑Brown and Twiss interferometer consisting of two silicon avalanche photodiodes placed on the output ports of a 50/50 beamsplitter. (b) Picture of a diamond SIL placed on a cover glass substrate. (c) Typical raster scan of a region close to the center of the SIL for a laser power of . The bright spot indicates a single NV defect, imaged with a signal to background ratio of 45:1. (d) PL spectrum showing a broad emission with a ZPL at [ symbol]. (e) Second-order autocorrelation function recorded for a laser power of .

Image of FIG. 3.
FIG. 3.

Background-corrected PL as a function of the laser intensity. Points correspond respectively to a single NV defect imaged through the diamond SIL and through a planar diamond surface. Solid lines are data fitting using a two-level model. The inset shows the signal to background ratio as a function of the laser intensity.


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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Monolithic diamond optics for single photon detection