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High energy (a) and (b) photoelectron spectra of praseodymia films deposited on a passivated (top) and a nonpassivated sample (bottom).
XSW data (dots) and fits (solid lines) of the photoelectron yield and the reflectivity (Refl.) in (111) direction depending on the incident photon energy for (a) the nonpassivated sample and the passivated samples (b) and (c).
Calculated coherent fractions for both (111) and (220) Bragg reflections as function of the vertical lattice constant [scaled to the Si(111) bilayer distance ].
Model of the praseodymia film deposited on Cl-passivated Si(111).
XSW data of the nonpassivated (top) and passivated (bottom) sample. The numeric error limits are derived from the fitting algorithm used to match the XSW data.
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