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Contactless, optical sample manipulation in an x-ray microbeam. Samples are delivered by microfluidics into the sample cell. A single particle is selected and trapped by multiple OT, through a high NA lens (not shown), allowing full control of sample positioning and orientation in the focused x-ray microbeam. The same lens is used to image the sample volume illuminated by a light-emitting diode (LED). The 2D x-ray diffraction pattern, corresponding to the local nanostructure of the sample, is recorded by the x-ray detector.
(a) Two x-ray mesh scans repeated for the same SG at different distances from the bottom wall, indicated by the x-ray refraction. The molecular orientations at different positions within the SG can be also easily observed. (b) The 2D diffraction pattern (SAXS-inner box, WAXS-outer box) originating from one x-ray shot.
Controlled radiation damage of SG fixed in multiple and single optical traps. [(a) and (b)] Optical image (top) and composite raster image of Porod constant (bottom) for a SG kept by three optical traps (dots), at the end of the first and second x-ray exposure series, when a first and, respectively, a second hole are drilled by the x-ray beam. Scale bar is . (c) Intensity of the WAXD peak at . Solid circles refer to the first exposure series and open circles to the second exposure series. (d) Porod constant. (e) Porod exponent. (f) Optical image (top) and composite raster image of Porod constant (bottom) for a SG kept in a single optical trap, at the end of the prolonged x-ray exposure series. (g) Intensity of the WAXD peak showing a nonmonotonical behavior. The arrows indicate the intensity values corresponding to the optical images at the bottom of the figure.
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