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Direct imaging of boron segregation to extended defects in silicon
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10.1063/1.3526376
/content/aip/journal/apl/97/24/10.1063/1.3526376
http://aip.metastore.ingenta.com/content/aip/journal/apl/97/24/10.1063/1.3526376
/content/aip/journal/apl/97/24/10.1063/1.3526376
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/content/aip/journal/apl/97/24/10.1063/1.3526376
2010-12-13
2014-07-26
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Direct imaging of boron segregation to extended defects in silicon
http://aip.metastore.ingenta.com/content/aip/journal/apl/97/24/10.1063/1.3526376
10.1063/1.3526376
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