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AFM analysis of QDs on Si (001). (a) A typical two-dimensional AFM image of the sample surface. (b) Height profile along the black line in (a).
Cross-sectional TEM images of QDs grown on Si (001). (a) A large area image of the sample surface. (Right) The FFT patterns of the QD and Si substrate. (b) A HRTEM image of QD showing the detailed lattice structure. (c) EDS showing that Ga, Mn, and As are present in the QDs.
SQUID measurements of QDs grown on Si (001). (a) The normalized field-dependent magnetization measured in the in-plane and out-of-plane directions. (Inset) The low field range. (b) ZFC and FC curves measured with an in-plane magnetic field of 200 Oe.
Normalized Mn -edge XANES spectra of QDs and film.
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