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(a) Schematic of a ZnO random laser diode array. (b) Light-light curve and emission spectra measured from the edge of the ZnO random laser array under optical excitation. Metal contacts have not been deposited to the sample for this optical experiment.
Voltage-current curve, light-current curve, and -factor vs injection current of the ZnO random laser diode array. The insert plots the EL spectra measured from the edge of the laser diode array at different bias conditions.
Measured (circles) and calculated (solid-line) near-field patterns from the edge of the laser diode array biased at . Lateral distribution of effective refractive index used for the calculation is also shown in the figure.
Normalized far-field patterns measured from the edge of the laser diode array under different bias conditions.
Power FT of the edge emission spectra of the laser diode array at different bias conditions. The inset diagram explains the interelement coupling of closed-loop random modes between adjacent random cavities.
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