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Quantum dot-cavity strong-coupling regime measured through coherent reflection spectroscopy in a very high-Q micropillar
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10.1063/1.3527930
/content/aip/journal/apl/97/24/10.1063/1.3527930
http://aip.metastore.ingenta.com/content/aip/journal/apl/97/24/10.1063/1.3527930
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

(a) Simplified scheme of the experimental setup. (b) Cavity reflectivity spectrum measured at excitation power (dots: raw data of the ratio normalized to unity out of resonance; solid line: Lorentzian fit).

Image of FIG. 2.
FIG. 2.

Coherent reflection spectroscopy of the QD-micropillar system at 2 nW excitation power (raw data), measured for various values of the pillar temperature. Each spectrum is shifted by an amount proportional to the corresponding temperature. The thin gray lines are a guide to the eyes.

Image of FIG. 3.
FIG. 3.

[(a)–(c)] Normalized cavity reflectivity [dots: experimental data; solid line: fit using Eq. (1)] when , , and , respectively. (d) Unperturbed frequencies (bold solid line) and (thin solid line), and left and right local reflectivity minima (dashed-dotted line and dashed line, respectively), as a function of temperature.

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/content/aip/journal/apl/97/24/10.1063/1.3527930
2010-12-17
2014-04-23
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Quantum dot-cavity strong-coupling regime measured through coherent reflection spectroscopy in a very high-Q micropillar
http://aip.metastore.ingenta.com/content/aip/journal/apl/97/24/10.1063/1.3527930
10.1063/1.3527930
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