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Field emission and material transfer in microswitches electrical contacts
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10.1063/1.3529474
/content/aip/journal/apl/97/26/10.1063/1.3529474
http://aip.metastore.ingenta.com/content/aip/journal/apl/97/26/10.1063/1.3529474
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

Schematic representation of the test setup based on an AFM.

Image of FIG. 2.
FIG. 2.

Typical evolution of voltage and current vs electrode gap during closure of the experimental electrical contact.

Image of FIG. 3.
FIG. 3.

Plot of the measurements of Fig. 2 (main peak) in the Fowler–Nordheim coordinate system.

Image of FIG. 4.
FIG. 4.

Observation by SEM of the contact area on the cantilever (anode) after 100 closures under 5 V. 45° tilted view.

Image of FIG. 5.
FIG. 5.

Observation by SEM of the contact area on the cantilever (cathode) after 100 closures under 5 V. Side view.

Image of FIG. 6.
FIG. 6.

Schematic representation of the complete mechanism of material transfer.

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/content/aip/journal/apl/97/26/10.1063/1.3529474
2010-12-29
2014-04-18
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Field emission and material transfer in microswitches electrical contacts
http://aip.metastore.ingenta.com/content/aip/journal/apl/97/26/10.1063/1.3529474
10.1063/1.3529474
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