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Control of defect-mediated tunneling barrier heights in ultrathin MgO films
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10.1063/1.3531652
/content/aip/journal/apl/97/26/10.1063/1.3531652
http://aip.metastore.ingenta.com/content/aip/journal/apl/97/26/10.1063/1.3531652
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

Optical absorption spectra of MgO(001)/MgO(50 nm) samples.

Image of FIG. 2.
FIG. 2.

(a) Topographic map of MgO barrier in MgO layer and local tunneling maps with 1 V bias of (b) and (c) MgO layers. Topographic map in MgO layer is nearly the same with (a). The rms roughness of (a) is 0.14 nm.

Image of FIG. 3.
FIG. 3.

(a) Distributions of local tunnel current from Figs. 2(b) and 2(c). Lines are the best fits with a logarithmic-normal distribution. (b) Distributions of topographic deviation from the nominal thickness of MgO barriers in and MgO layers. These distributions fit well with a Gaussian function, where the standard deviation is 0.26 and 0.25 for and MgO layers, respectively.

Image of FIG. 4.
FIG. 4.

Current-voltage curves of and MgO layers, measured at hotspot and background using conductive tip.

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/content/aip/journal/apl/97/26/10.1063/1.3531652
2010-12-28
2014-04-18
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Control of defect-mediated tunneling barrier heights in ultrathin MgO films
http://aip.metastore.ingenta.com/content/aip/journal/apl/97/26/10.1063/1.3531652
10.1063/1.3531652
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