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(a) AFM image of 11 ML QWRs (inset shows corresponding 3D image); (b) fragments of surface profiles: along the QWR (corresponds to white line on AFM image) (curve 1) and perpendicular to it (curve 2); (c) histogram of interface height roughness and (d) histogram of interface base roughness determined from the surface profile along QWRs (curve 1). Corresponding distributions are fit by Gaussian functions shown by solid lines.
(a) PPL spectra with light polarization along QWRs and orthogonal to it, (b) polar plots of the PPL peak intensity, and (c) PPL at high excitation intensity for light polarized along QWRs.
(a) Electron mobility and resistance measured by TDH effect along QWRs and orthogonal to it ; (b) anisotropy of mobility and conductivity shown for comparison; (c) calculated mobility (thick solid curve) and measured mobility along QWRs (circles). The calculations were performed in approximation of 2D electron gas for different scattering mechanisms.
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