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Schematics of planar SRRs fabricated on a (a) thin silicon nitride substrate of thick, i.e., -SRRs, and a (b) silicon (Si) bulk substrate of thick, i.e., Si-SRRs. (c) Simulation of the norm of the electric field at resonance. [(d) and (e)] Cross-section view of the electric field penetration at resonance for Si-SRRs and -SRRs, respectively.
Simulation results show that MMs on substrates show better sensitivity of different (a) thicknesses and (b) dielectric constants than MMs on Si substrates. (Insets) Two SRR designs are used, respectively. All dimensions are in microns.
Terahertz TDS measured frequency-dependent transmission spectra of -SRRs and Si-SRRs without and with an overlayer of silk fibroin film with various thicknesses of 500 nm, 750 nm, and .
Terahertz TDS measured frequency-dependent transmission spectra of -SRRs and Si-SRRs without any coating and with an overlayer of thick silk fibroin film doped with 0.1 mM RHB and 0.1 mM RB.
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