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Response to “Comment on ‘Nanometer resolution piezoreponse force microscopy to study deep submicron ferroelectric and ferroelastic domains’ ” [Appl. Phys. Lett.97, 046101 (2010)]
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2010-07-29
2014-10-22

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Scitation: Response to “Comment on ‘Nanometer resolution piezoreponse force microscopy to study deep submicron ferroelectric and ferroelastic domains’ ” [Appl. Phys. Lett.97, 046101 (2010)]
http://aip.metastore.ingenta.com/content/aip/journal/apl/97/4/10.1063/1.3467006
10.1063/1.3467006
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