1887
banner image
No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
Direct observation of microscopic change induced by oxygen vacancy drift in amorphous thin films
Rent:
Rent this article for
USD
10.1063/1.3467854
/content/aip/journal/apl/97/4/10.1063/1.3467854
http://aip.metastore.ingenta.com/content/aip/journal/apl/97/4/10.1063/1.3467854
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

(a) I-V characteristics of devices deposited at various temperatures (150, 180, 200, and ). The HRTEM image of stacked structure is shown in the left inset. (b) I-V characteristics of devices deposited at 150 and measured during negative sweeps. The left inset shows the real photograph of our memory device.

Image of FIG. 2.
FIG. 2.

(a) and (b) show the HRTEM images of stacks deposited at for the off and on state, respectively. denotes the thickness of the whole layer including both interface layers and is defined as the thickness of the top interface layer (Al–Ti–O). (c) and (d) present the statistical results of the and for the each state, respectively.

Image of FIG. 3.
FIG. 3.

(a) and (b) show the BFTEM images of structure deposited at for the off and on state, respectively. (c) HRTEM image of the black-contrast region in (b). (d) is the enlarged HRTEM image of region marked with red dot lines of (c).

Image of FIG. 4.
FIG. 4.

Schematic models showing the difference of the oxygen vacancy drift in amorphous thin films between (a) and (b) devices.

Loading

Article metrics loading...

/content/aip/journal/apl/97/4/10.1063/1.3467854
2010-07-28
2014-04-24
Loading

Full text loading...

This is a required field
Please enter a valid email address
752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Direct observation of microscopic change induced by oxygen vacancy drift in amorphous TiO2 thin films
http://aip.metastore.ingenta.com/content/aip/journal/apl/97/4/10.1063/1.3467854
10.1063/1.3467854
SEARCH_EXPAND_ITEM