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XRD pattern of LCMO/LSAO sample. The inset shows the diffraction peak of LCMO film.
Cross-sectional TEM images of (a) LCMO/LSAO sample and (b) LSMO/LSAO interface. The dashed lines denote the interface position.
(a) The photovoltaic pulses for LCMO/LSAO under the illumination of a 248 nm laser at different biases recorded by an oscilloscope with an input impedance of at room temperature The inset displays the schematic circuit of the measurement. (b) The photoinduced voltage defined by as a function of the applied bias . The inset shows that as a function of the applied bias .
(a) The photovoltaic pulses and (b) peak photocurrent for LCMO/LSAO under the illumination of a 248 nm laser at different biases recorded by an oscilloscope with a parallel resistance of .
(a) The schematic drawing under the irradiation. (b) The difference of the carry destiny caused by the miscut angle. (c) The transient movement of the photogenerated carriers of the LCMO.
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