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High resolution XPS of photoelectrons from WCO (left) and CT (right) boron-doped polycrystalline diamond surfaces. Also shown (continuous lines) is the result of a deconvolution using Voigt functions, which yields two subpeaks chemically shifted by oxygen (filled peaks A and B). The inset shows the relative fraction of photoelectrons from oxygen-bound carbon atoms for the WCO, CT, and a HPT sample.
Cyclic voltammograms of 1 mM in 0.1 M KCl at a scan rate of on WCO, HPT, and CT diamond electrodes.
(a) Secondary electron SEM image of partially CT boron-doped diamond electrode. The left part was covered by a silicone rubber and is WCO while −35 V had been applied to right part for 1 min in a 2 M HCl solution. (b) Contact angle of a droplet of de-ionized water for a WCO diamond sample (top) and a CT (−35 V, 5 min) sample (bottom), respectively. The schematic drawing shows electronegativity differences in the Pauling scale.
Relative fractions of chemically shifted components as determined by deconvolution of the XPS measurements.
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