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Nanomeasurements of electronic and mechanical properties of fullerene embedded Si(111) surfaces
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10.1063/1.3475775
/content/aip/journal/apl/97/6/10.1063/1.3475775
http://aip.metastore.ingenta.com/content/aip/journal/apl/97/6/10.1063/1.3475775
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

STM images with profiles analysis of (a) single embedded Si(111) surface, (b) Si(111) superlattice surface, and (c) close up view of a molecule on a self-assembled surface.

Image of FIG. 2.
FIG. 2.

The (dI/dV) vs voltage curve of the self-assembled embedded Si surfaces determined by UHV-STM with an enlarged scale of the z-axis in the inset.

Image of FIG. 3.
FIG. 3.

Field emission current density vs electric field curve of the self-assembled embedded surface measured by (a) Keithley 237 source-measure unit and (b) UHV-STM, respectively. Insets show the corresponding F-N plot.

Image of FIG. 4.
FIG. 4.

Force-distance analysis of the Si disordered surface, surface, a single layer of the self-assembled embedded Si surface and SiC surface by UHV-AFM.

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/content/aip/journal/apl/97/6/10.1063/1.3475775
2010-08-11
2014-04-20
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Nanomeasurements of electronic and mechanical properties of fullerene embedded Si(111) surfaces
http://aip.metastore.ingenta.com/content/aip/journal/apl/97/6/10.1063/1.3475775
10.1063/1.3475775
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