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Low-frequency noise in strained SiGe core-shell nanowire p-channel field effect transistors
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10.1063/1.3480424
/content/aip/journal/apl/97/7/10.1063/1.3480424
http://aip.metastore.ingenta.com/content/aip/journal/apl/97/7/10.1063/1.3480424
/content/aip/journal/apl/97/7/10.1063/1.3480424
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/content/aip/journal/apl/97/7/10.1063/1.3480424
2010-08-19
2014-11-26
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Low-frequency noise in strained SiGe core-shell nanowire p-channel field effect transistors
http://aip.metastore.ingenta.com/content/aip/journal/apl/97/7/10.1063/1.3480424
10.1063/1.3480424
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