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Influence of electrode size on resistance switching effect in nanogap junctions
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10.1063/1.3481067
/content/aip/journal/apl/97/7/10.1063/1.3481067
http://aip.metastore.ingenta.com/content/aip/journal/apl/97/7/10.1063/1.3481067
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Figures

Image of FIG. 1.
FIG. 1.

(a) Schematic of nanogap junction on Au nanowire. (b) FE-SEM image of a typical nanogap junction immediately after electromigration. FE-SEM images of nanowires and the nanogap junctions formed in 350 nm (c), 180 nm (d), and 45 nm (e) wide nanowires.

Image of FIG. 2.
FIG. 2.

Memory effect in a nanogap junction with a 45 nm linewidth. (a) Characteristics of repeated on and off cycles. On- and off-states were attained according to the bias voltage diagram shown in (b).

Image of FIG. 3.
FIG. 3.

(a) Typical current-voltage characteristics for nanogap junctions with linewidths of 45, 90, 180, 350, and 640 nm. (b) Average maximum current across nanogap junction at each linewidth.

Image of FIG. 4.
FIG. 4.

(a) Experimental and fitted current-voltage curves for nanogap junctions with linewidths of 45, 90, 180, 350, and 640 nm. The fitted curves were estimated using the tunneling equation. (b) Gap width, work function, and emission area were obtained from the fitted curve in (a). (c) Plots of maximum currents vs emission areas.

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/content/aip/journal/apl/97/7/10.1063/1.3481067
2010-08-20
2014-04-17
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Influence of electrode size on resistance switching effect in nanogap junctions
http://aip.metastore.ingenta.com/content/aip/journal/apl/97/7/10.1063/1.3481067
10.1063/1.3481067
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