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(a) RHEED intensity oscillations recorded during the growth of film on LSAT (001) substrate. (b) X-ray diffraction pattern of the film showing (001) oriented epitaxial structure. Inset is the magnified (002) peak (solid line) and simulated one (dotted line) with a thickness of 96 nm.
Cross sectional TEM images. Arrows in (a) indicate planar defects due to out-of-phase boundaries (Ref. 11). High resolution image in (b) shows coherent connection of both lattices.
(a) Resistivity as a function of temperature under various magnetic fields applied parallel to the -axis of the film. Inset shows resistivity as a function of temperature at higher temperatures . (a) Resistivity as a function of applied magnetic field at 0.4 K. The magnetic field was applied either parallel or perpendicular to the -axis of the film.
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