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Growth of superconducting thin films
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10.1063/1.3481363
/content/aip/journal/apl/97/8/10.1063/1.3481363
http://aip.metastore.ingenta.com/content/aip/journal/apl/97/8/10.1063/1.3481363
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

(a) RHEED intensity oscillations recorded during the growth of film on LSAT (001) substrate. (b) X-ray diffraction pattern of the film showing (001) oriented epitaxial structure. Inset is the magnified (002) peak (solid line) and simulated one (dotted line) with a thickness of 96 nm.

Image of FIG. 2.
FIG. 2.

Cross sectional TEM images. Arrows in (a) indicate planar defects due to out-of-phase boundaries (Ref. 11). High resolution image in (b) shows coherent connection of both lattices.

Image of FIG. 3.
FIG. 3.

(a) Resistivity as a function of temperature under various magnetic fields applied parallel to the -axis of the film. Inset shows resistivity as a function of temperature at higher temperatures . (a) Resistivity as a function of applied magnetic field at 0.4 K. The magnetic field was applied either parallel or perpendicular to the -axis of the film.

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/content/aip/journal/apl/97/8/10.1063/1.3481363
2010-08-26
2014-04-25
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Growth of superconducting Sr2RuO4 thin films
http://aip.metastore.ingenta.com/content/aip/journal/apl/97/8/10.1063/1.3481363
10.1063/1.3481363
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