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(a) XRD pattern of a 300 nm thick Ba–Sn–O film on a substrate, showing no secondary phases. (b) and (c) show high-resolution profiles for the (002) and (004) reflections. The Ba–Sn–O phase and the satellite peaks are marked with “○” and “→,” respectively.
(a) RSM around the Bragg reflection for a 300 nm thick Ba–Sn–O film. (b) Atomic force microscope image of a Ba–Sn–O film, showing a step-and-terrace film surface. (c) shows an expanded RSM of the Ba–Sn–O reflection encircled by the red dashed line in (a). The JCPDS lattice parameter of stoichiometric is marked with “×.”
[(a)–(c)] Periodicity, lattice parameters, and core level photoemission peak intensity ratio are plotted as a function of the laser pulse repetition rate. The dotted line indicates corresponding data for a reference. Samples on and substrate are plotted with circles (blue) and triangles (red), respectively.
Periodicity of the Ba–Sn–O thin film superstructure as a function of deposition rate. The inset shows an Arrhenius plot, giving an activation energy estimate for diffusion of 0.1 eV.
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