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(a) A schematic configuration of Cu/AlN/Pt device. (b) Low-magnification cross section TEM image of the AlN films. (c) XRD patterns of AlN films deposited on substrates.
(a) curve of Cu/AlN/Pt device on semilog scale. (b) The linear fitting of curve in log-log scale and the corresponding slopes for each portion.
Temperature dependent resistance in (a) LRS and (b) HRS. (c) The dependence of on CC.
(a) Endurance performance and (b) retention of the Cu/AlN/Pt devices. The resistance was read out at 0.1 V.
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