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(a) Schematic illustration of measurement setup. (b) I-V property for Pt film on film as a function of bias. Open symbols show forward bias conditions and solid symbols show reverse bias conditions. (c) HX-PES of as a function of TOA under zero bias and (d) as a function of bias at a TOA of 20°.
HX-PES of (a) and (b) for the diode under a bias of −150 mV (reverse bias) at a TOA of 20°. Solid lines show spectra and open circles show sum-fitted curves. Dashed lines are fitted curves for each bond: Pt, PtO, , and HfPt.
Applied bias dependences of (a) intensity of PtO (circles), (b) intensity ratio of HfPt (squares), and (c) intensity of (triangles). All spectra were normalized by the intensity of Pt at 0 V (initial state). Open symbols show forward bias conditions and solid symbols show reverse bias conditions.
Schematic illustration of the interface at (a) initial state, under (b) forward bias, and (c) reverse bias.
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