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(a), (b), (c) AFM images of sapphire substrates with rms roughness of 1, 7 and 13 nm, respectively. (d) Schematic of the experimental setup for the reflectance measurement. (e) Measured reflectance as a function of rms roughness.
(a), (d) Electric field intensity profile in silver (a) and aluminum (d). (b), (e) Absorption power density in silver (b) and aluminum (e) with , 20, and 50 nm. (c), (f) Absorption power density as a function of the distance from the nanopattern in silver (c) and aluminum (f).
(a) Calculated reflectance in silver and aluminum as a function of the rms roughness. The inset shows the metal surface with a rms roughness of 8 nm, modeled in the simulation. (b), (c) Electric field intensity profiles in silver (b) and aluminum (c) with a rms roughness of 8 nm, respectively.
(a) Schematic of a GaN LED structure with a silver or aluminum bottom reflector. (b) Output powers measured at 80 mA as a function of the rms roughness when the bottom metal is silver or aluminum.
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