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X-ray diffraction spectra of (a) the polycrystalline FePt film, (b) the epitaxial film prepared by the co-sputtering, and epitaxial films prepared by depositing superlattice with (c) 54 nm and (d) 28 nm.
Time-resolved reflectivity change in probe light in a 54-nm-thick polycrystalline FePt film: multiple reflection echoes were observed . Roundtrip time was determined from the slope of the time delay vs (inset).
Film-thickness dependence of (a) the out-of-plane elastic stiffness , (b) coercivity , and (c) uniaxial magnetic anisotropy energy . Open circles denote polycrystalline films deposited on glass substrates. Dots designate epitaxial films fabricated by depositing superlattices on MgO. Triangle denotes an epitaxial film prepared by co-sputtering on MgO. In (c), insets show typical AFM images.
Comparison of determined elastic constant (GPa) to calculated values.
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