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The Zn-polar (0001) and O-polar hydroxyl-terminated faces of wurtzite ZnO.
core-level XPS spectra (pass ) taken at incident photon energies from 1486 to 600 eV on the Zn-polar, O-polar, and -plane faces of organic-solvent cleaned HT ZnO.
VB-XPS spectra (pass ) from the polar and nonpolar faces of HT and PM bulk ZnO measured using [(a)–(d)] radiation (1486.6 eV) and [(e) and (f)] synchrotron radiation (1486 to 150 eV). The spectra in [(b) and (d)] were collected at a take-off angle .
VB-XPS spectra from the polar faces of (a) CdS and (b) CdSe c-axis single crystals, measured using radiation.
XPS quantification analysis of the organic-solvent cleaned Zn-polar, O-polar, and -plane faces of HT ZnO before and after 20 min ROP exposure.
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