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XRD spectra for bilayer composite samples before and after annealing with different temperatures.
(a) Surface morphologies of as-prepared samples; (b) cross-section image for the as prepared bilayer ; [(c)–(f)] annealed samples at , , , and , respectively.
EDX mapping for the annealed sample at . (a) The surface morphology image for the sample; (b)–(d) Si, V, and Zn elements surface distribution on the sample surface.
Room-temperature PL spectra for samples before and after annealed at different temperatures. For comparison, the pure after annealed at was also figured.
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