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SP distribution of areas irradiated by electron beam. Matrix of points was irradiated in each area. Electron beam current and irradiation times for each point are show on the left side of every image. SP profile of cross-section through two irradiated points is shown under each image. The applied charge dosage: (a) 9,8 nC; (b) 98 nC; (c) 980 nC; (d) 14 nC; (e) 98 nC, and (f) 980 nC.
AFM topography of HA surface (a) before electron beam irradiation (b) the same area after irradiation with same parameters as in Fig. 1(f). (c) SP distribution after one month in the sample shown in Fig. 1(b).
XPS surface chemical analysis of HA thin films untreated and irradiated by electron beam (20 keV and 14 nA) for 1 and 7 s.
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