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Nondestructive estimation of depletion layer profile in Nb-doped heterojunction diode structure by hard x-ray photoemission spectroscopy
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10.1063/1.3571454
/content/aip/journal/apl/98/13/10.1063/1.3571454
http://aip.metastore.ingenta.com/content/aip/journal/apl/98/13/10.1063/1.3571454
/content/aip/journal/apl/98/13/10.1063/1.3571454
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/content/aip/journal/apl/98/13/10.1063/1.3571454
2011-03-30
2015-07-06
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Nondestructive estimation of depletion layer profile in Nb-doped SrTiO3/(La,Ba)MnO3 heterojunction diode structure by hard x-ray photoemission spectroscopy
http://aip.metastore.ingenta.com/content/aip/journal/apl/98/13/10.1063/1.3571454
10.1063/1.3571454
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